TY  - BOOK
AU  - Evans,John Martin
AU  - Kirsch,Russell
AU  - Nagel,Roger N.
ED  - Workshop on Standards for Image Pattern Recognition,
ED  - United States.
TI  - Computer science & technology: proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976 
T2  - NBS special publication ; 500-8
AV  - QC100TA1650 .U57 no. 500-8
U1  - 602/.1 s621.381.9/598 
PY  - 1977///
CY  - [Washington]
PB  - U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
KW  - Optical pattern recognition
KW  - Standards
KW  - United States
ER  -